● The Advantest Q8347 is an optical spectrum analyzer employing a Michelson interferometer
● High resolution wavelength measurement of 0.01nm at 1.5μm band and 0.001nm at 0.5μm band
● Coherent length can be measured
The coherent length, which cannot be measured by dispersion spectroscopy using a grading based spectrum analyzer, can be measured by Q8347 using the Michelson interference method. Therefore, the Q8347 can easily determine the noise suppression performance of the CD/VD laser diode due to the reflected light. The analysis range is as wide as +/-165mm.
● High-speed measurement
As the analyzer employs Fourier spectroscopy using Michelson interferometer, high speed measurement is realized.
● +/-0.01nm wavelength measurement accuracy
As a He-Ne laser is used as internal reference light source, a high wavelength accuracy of 0.01nm is realized. Wavelength calibration is not required.
● Easy operation
Various aspects have been taken into consideration to make measurement easier. The panel key arrangement, Soft-key menus and basic key function can be specified in the first hierarchy. The Q8347 has a built-in level meter which greatly facilitates adjustment of the measurement light coupling.
● Zoom function
The measurement data can be analyzed again and displayed with the zoom function. Data can be displayed from wide to narrow span without repeating measurement.
● Various processing functions
They include four types of FWHM measurement function, an automatic peak search function, four types of cursor indication modes, a peak value sting function and 16 data memory areas.
● Built-in high-speed printer
Measurement data can be easily output using a high-speed thermal printer having a printing speed of less than 8 seconds.
Wavelength 350nm - 1750 nm
Resolution 0.001nm / 500nm (high resolution mode)
0.003nm / 850nm (high resolution mode)
0.01nm / 1550nm (high resolution mode)
0.05 nm / 850nm (normal resolution mode)
0.1 nm / 1550nm (normal resolution mode)
Wavelength Accuracy ±0.01 nm or less (high resolution mode)
±0.1 nm or less (normal resolution mode)
Span 0.01nm /DIV to 140nm/DIV
Input Sensitivity -72 dBm to +10 dBm (1.2 μm to 1.6 μm)
-65 dBm to +10 dBm (0.7 μm to 1.6 μm)
-52 dBm to +10 dBm (0.45 μm to 1.7 μm)
-42 dBm to +10 dBm (0.35 μm to 1.7 μm)
Level accuracy ±1.0dB (780nm), ± 0.7dB (1310,1550 nm)
Dynamic range 35dB or more
Repeatability including polarization dependence ±0.1dB or less at 1550nm
Level scale 0.2, 0.5, 1.0, 2.0, 5.0, 10.0 dB/DIV and linear
Measurement time 1 second or less
Memory function 16 screens ( measurement data) with battery backup
10 screens (measurement condition) with battery backup
Floppy disk (MS-DOS format: 720KB / 1.2 MB)
Display Frequency, superimpose, 3-dimensional trend monitor (power,
Wavelength), dual screen (up/down) display, cursor function,
Color display customization, Listing
Calculation Analysis ●Spectrum analysis ●Coherence analysis ●Spectral half-width
Calculation ●Averaging ●Automatic optimum measurement
●Smoothing ●Automatic peak search ●Normalizing ● Curve
Fit ● MAX/MIN hold
Optical Input connector FC connector
Data Output ●GPIB Standard equipment ● direct plotter ● Built-in printer\
External Dimensions Main unit: 424(W) X 221(H) X 500(D) mm
Optical unit: 424 (W) X 132(H) X 500(D) mm
Mass Main unit: about 16 Kg
Optical unit about 20 Kg